Research Catalog
Electronic device failure analysis news.
- Title
- Electronic device failure analysis news.
- Publication
- Materials Park, OH : ASM International, 1999-
Available Online
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1 Item
| Status | Vol/Date | Format | Access | Call Number | Item Location |
|---|---|---|---|---|---|
| fall (1998) | Text | Request in advance | JSM 99-259 fall (1998) | Offsite |
Holdings
- Location
- Schwarzman Building - Main Reading Room 315
- Format
- Call Number
- JSM 99-259
- Library Has
- Fal(1998).
Details
- Additional Authors
- Publication Date
- Fall 1998-
- Description
- v. : ill.; 27 cm.
- Alternative Title
- EDFAN
- Failure analysis news
- Subjects
- Note
- Title from caption.
- Numbering (note)
- Issue for fall 1998 called Premier issue.
- Additional Formats (note)
- Also available to subscribers online as a PDF file.
- Issued By (note)
- Issued by: Electronic Device Failure Analysis Society, an affiliate Society of ASM International.
- Call Number
- JSM 99-259
- ISSN
- 1521-9259
- LCCN
- sn 98001193
- OCLC
- 39949239
- Title
- Electronic device failure analysis news.
- Imprint
- Materials Park, OH : ASM International, 1999-
- Current Frequency
- Semiannual
- Numbering
- Issue for fall 1998 called Premier issue.
- Additional Formats
- Also available to subscribers online as a PDF file.
- Issued By
- Issued by: Electronic Device Failure Analysis Society, an affiliate Society of ASM International.
- Connect to:
- Added Author
- ASM International.Electronic Device Failure Analysis Society.
- Other Form:
- Electronic device failure analysis news (Online) (DLC)sn 99003481 (OCoLC)40864404
- Research Call Number
- JSM 99-259