Research Catalog

Design-for-test for digital IC's and embedded core systems

Title
Design-for-test for digital IC's and embedded core systems / Alfred L. Crouch.
Author
Crouch, Alfred L.
Publication
Upper Saddle River, NJ : Prentice Hall PTR, c1999.

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2 Items

StatusFormatAccessCall NumberItem Location
TextRequest in advance JSE 00-23 (Main work)Offsite
TextBy appointment only *WSC-3089Offsite

Details

Description
xxvii, 349 p. : ill.; 25 cm. +
Subject
  • Digital integrated circuits > Design and construction
  • Electronic circuit design
  • Automatic test equipment
  • Embedded computer systems > Design and construction
Bibliography (note)
  • Includes bibliographical references and index.
Call Number
JSE 00-23
ISBN
0130848271
LCCN
99023871
OCLC
vendor
Author
Crouch, Alfred L.
Title
Design-for-test for digital IC's and embedded core systems / Alfred L. Crouch.
Imprint
Upper Saddle River, NJ : Prentice Hall PTR, c1999.
Bibliography
Includes bibliographical references and index.
Research Call Number
JSE 00-23 [Text]
*WSC-1040 [Computer disc]
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