Research Catalog

Design-for-test for digital IC's and embedded core systems

Title: Design-for-test for digital IC's and embedded core systems / Alfred L. Crouch.
Author: Crouch, Alfred L.
Publication: Upper Saddle River, NJ : Prentice Hall PTR, c1999.

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Item details
Status	Format	Access	Call Number	Item Location
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	Book/Text	Request in advance	JSE 00-23 (Main work)	Offsite
Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	Book/Text	By appointment only	*WSC-3089	Offsite

Description

xxvii, 349 p. : ill.; 25 cm. +

Subjects

Bibliography (note)

Call Number

JSE 00-23

ISBN

0130848271

LCCN

99023871

OCLC

vendor

Author

Crouch, Alfred L.

Title

Design-for-test for digital IC's and embedded core systems / Alfred L. Crouch.

Imprint

Upper Saddle River, NJ : Prentice Hall PTR, c1999.

Bibliography

Includes bibliographical references and index.

Research Call Number

JSE 00-23 [Text]

*WSC-1040 [Computer disc]