Research Catalog
Design-for-test for digital IC's and embedded core systems
- Title
- Design-for-test for digital IC's and embedded core systems / Alfred L. Crouch.
- Author
- Crouch, Alfred L.
- Publication
- Upper Saddle River, NJ : Prentice Hall PTR, c1999.
Items in the Library & Off-site
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2 Items
Status | Format | Access | Call Number | Item Location |
---|---|---|---|---|
Text | Request in advance | JSE 00-23 (Main work) | Offsite | |
Text | By appointment only | *WSC-3089 | Offsite |
Details
- Description
- xxvii, 349 p. : ill.; 25 cm. +
- Subject
- Bibliography (note)
- Includes bibliographical references and index.
- Call Number
- JSE 00-23
- ISBN
- 0130848271
- LCCN
- 99023871
- OCLC
- vendor
- Author
- Crouch, Alfred L.
- Title
- Design-for-test for digital IC's and embedded core systems / Alfred L. Crouch.
- Imprint
- Upper Saddle River, NJ : Prentice Hall PTR, c1999.
- Bibliography
- Includes bibliographical references and index.
- Research Call Number
- JSE 00-23 [Text]*WSC-1040 [Computer disc]