Research Catalog

ITC : International Test Conference 1999 proceedings : September 28-30, 1999, New Atlantic City Convention Center, Atlantic City, NJ, USA

Title: ITC : International Test Conference 1999 proceedings : September 28-30, 1999, New Atlantic City Convention Center, Atlantic City, NJ, USA / sponsored by IEEE Computer Society Test Technology Technical Committee, and IEEE Philadelphia Section.
Author: International Test Conference (30th : 1999 : Atlantic City, N. J.)
Publication: Washington, DC : International Test Conference ; Piscataway New Jersey : IEEE, c1999.

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Details

Additional Authors

Description

xiv, 1163 p. : ill.; 29 cm.

Alternative Title

1999 IEEE International Test Conference
Proceedings International Test Conference 1999

Subject

Note

Cover title.
"IEEE Catalog Number 99CH37034"--verso of T.p.

Bibliography (note)

Includes bibliographical references and author index.

Call Number

JSF 99-847

ISBN

0780357531 (softbound)
078035754X (casebound)
0780357558 (microfiche)

OCLC

42960032

Conference

International Test Conference (30th : 1999 : Atlantic City, N. J.)

Title

ITC : International Test Conference 1999 proceedings : September 28-30, 1999, New Atlantic City Convention Center, Atlantic City, NJ, USA / sponsored by IEEE Computer Society Test Technology Technical Committee, and IEEE Philadelphia Section.

Imprint

Washington, DC : International Test Conference ; Piscataway New Jersey : IEEE, c1999.

Bibliography

Includes bibliographical references and author index.

Added Author

IEEE Computer Society.

Institute of Electrical and Electronics Engineers. Philadelphia Section.

Research Call Number

JSF 99-847

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