Research Catalog

Uncertainty analysis of instrument calibration and application

Title: Uncertainty analysis of instrument calibration and application [microform] / John S. Tripp and Ping Tcheng.
Author: Tripp, John S.
Publication: Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1999]

Details

Additional Authors

Description

1 v.

Series Statement

NASA/TP ; 1999-209545

Uniform Title

NASA technical paper ; 209545.

Subject

Note

Shipping list no.: 2000-0278-M.

Reproduction (note)

Microfiche.

Call Number

READEX Microfiche NAS 1.60:209545

OCLC

marcive43417564

Author

Tripp, John S.

Title

Uncertainty analysis of instrument calibration and application [microform] / John S. Tripp and Ping Tcheng.

Imprint

Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1999]

Series

NASA/TP ; 1999-209545

NASA technical paper ; 209545.

Reproduction

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1999] 1 microfiche.

Added Author

Tcheng, Ping.

Langley Research Center.

Gpo Item No.

0830-H-15 (MF)

Sudoc No.

NAS 1.60:209545

Research Call Number

READEX Microfiche NAS 1.60:209545

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