Research Catalog
Project portfolio
- Title
- Project portfolio [microform]
- Author
- National Semiconductor Metrology Program (U.S.)
- Publication
- Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1996-
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Holdings
Details
- Additional Authors
- National Institute of Standards and Technology (U.S.). Office of Microelectronics Programs.
- Publication Date
- Fiscal year 1996-
- Description
- v.; 28 cm.
- Series Statement
- NISTIR
- Subjects
- Additional Formats (note)
- Also available via the Internet at the National Semiconductor Metrology Program web site. Address as of: 05/03/00: http://www.eeel.nist.gov/omp/table.htm; current access is available via PURL.
- Reproduction (note)
- Microfiche.
- Issued By (note)
- Program administered by the National Institute of Standards and Technology's Office of Microelectronics Programs.
- Call Number
- READEX Microfiche C 13.58:5851/
- LCCN
- sn 99034998
- OCLC
- marcive40978495
- Author
- National Semiconductor Metrology Program (U.S.)
- Title
- Project portfolio [microform]
- Imprint
- Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1996-
- Current Frequency
- Annual
- Series
- NISTIR
- Additional Formats
- Also available via the Internet at the National Semiconductor Metrology Program web site. Address as of: 05/03/00: http://www.eeel.nist.gov/omp/table.htm; current access is available via PURL.
- Reproduction
- Microfiche. 1997- [Washington, D.C.] : Supt. of Docs., U.S. G.P.O. 1998- microfiches : negative.
- Issued By
- Program administered by the National Institute of Standards and Technology's Office of Microelectronics Programs.
- Connect to:
- Added Author
- National Institute of Standards and Technology (U.S.). Office of Microelectronics Programs.
- Gpo Item No.
- 0247-D (MF)0247-D (online)
- Sudoc No.
- C 13.58:C 13.58:5851/
- Research Call Number
- READEX Microfiche C 13.58:5851/