Research Catalog

The influence of modulated signal risetime in flight electronics radiated immunity testing with a mode-stirred chamber

Title
The influence of modulated signal risetime in flight electronics radiated immunity testing with a mode-stirred chamber [microform] / Jay J. Ely, Truong X. Nguyen, Stephen A. Searce.
Author
Ely, Jay J.
Publication
Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; Hanover, MD : Available from NASA Center for AeroSpace Information ; Springfield, VA : National Technical Information Service [distributor, 2000]

Details

Additional Authors
  • Nguyen, Truong X.
  • Scearce, Stephen A.
  • Langley Research Center.
Description
1 v.
Series Statement
NASA/TM ; 2000-209844
Uniform Title
NASA technical memorandum ; 209844.
Subject
  • Field tests
  • Service life
  • Field strength
  • Electromagnetic compatibility
Note
  • Shipping list no.: 2000-0596-M.
Reproduction (note)
  • Microfiche.
Call Number
READEX Microfiche NAS 1.15:209844
OCLC
marcive44163738
Author
Ely, Jay J.
Title
The influence of modulated signal risetime in flight electronics radiated immunity testing with a mode-stirred chamber [microform] / Jay J. Ely, Truong X. Nguyen, Stephen A. Searce.
Imprint
Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; Hanover, MD : Available from NASA Center for AeroSpace Information ; Springfield, VA : National Technical Information Service [distributor, 2000]
Series
NASA/TM ; 2000-209844
NASA technical memorandum ; 209844.
Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 2000] 1 microfiche.
Added Author
Nguyen, Truong X.
Scearce, Stephen A.
Langley Research Center.
Gpo Item No.
0830-D (MF)
Sudoc No.
NAS 1.15:209844
Research Call Number
READEX Microfiche NAS 1.15:209844
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