Research Catalog

The effect of interface roughness and oxide film thickness on the inelastic response of thermal barrier coatings to thermal cycling

Title
The effect of interface roughness and oxide film thickness on the inelastic response of thermal barrier coatings to thermal cycling [microform] / Marek-Jerzy Pindera, Jacob Aboudi, Steven M. Arnold.
Author
Pindera, M.-J. (Marek-Jerzy), 1951-
Publication
Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center ; Hanover, MD : Available from NASA Center for Aerospace Information ; Springfield, VA : National Technical Information Service [distributor, 1999]

Details

Additional Authors
  • Aboudi, Jacob, 1935-
  • Arnold, S. M.
  • NASA Glenn Research Center.
Description
1 v.
Series Statement
NASA/TM ; 2000-209770
Uniform Title
NASA technical memorandum ; 209770.
Subject
  • Interfaces
  • Oxide films
  • Thickness
  • Surface roughness
  • Temperature effects
  • Stress distribution
  • Film thickness
Note
  • Shipping list no.: 2000-0596-M.
Reproduction (note)
  • Microfiche.
Call Number
READEX Microfiche NAS 1.15:209770
OCLC
marcive44121817
Author
Pindera, M.-J. (Marek-Jerzy), 1951-
Title
The effect of interface roughness and oxide film thickness on the inelastic response of thermal barrier coatings to thermal cycling [microform] / Marek-Jerzy Pindera, Jacob Aboudi, Steven M. Arnold.
Imprint
Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center ; Hanover, MD : Available from NASA Center for Aerospace Information ; Springfield, VA : National Technical Information Service [distributor, 1999]
Series
NASA/TM ; 2000-209770
NASA technical memorandum ; 209770.
Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 2000] 1 microfiche.
Added Author
Aboudi, Jacob, 1935-
Arnold, S. M.
NASA Glenn Research Center.
Gpo Item No.
0830-D (MF)
Sudoc No.
NAS 1.15:209770
Research Call Number
READEX Microfiche NAS 1.15:209770
View in Legacy Catalog