Research Catalog

Title

Symposium on X-Ray and Electron Probe Analysis; [papers] presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963.

Author

Symposium on X-Ray and Electron Probe Analysis (1963 : Atlantic City)

Publication

Philadelphia, American Society for Testing and Materials [1964]

Items in the Library & Off-site

Details

Additional Authors

• ASTM Committee E-2 on Emission Spectroscopy.
• American Society for Testing and Materials. Committee E-4 on Metallography.

Description

vi, 209 p. illus.; 24 cm.

Series Statement

ASTM special technical publication no. 349

Uniform Title

ASTM special technical publication ; no. 349.

Subject

• X-ray spectroscopy > Congresses
• Probes (Electronic instruments) > Congresses

Note

• Sponsored jointly by ASTM Committees E-2 on Emission Spectroscopy and E-4 on Electron Metallography.

Bibliography (note)

• Includes bibliographies.

Call Number

VEE (American Society for Testing Materials. Special technical publication. no. 349)

LCCN

63021661

OCLC

2171048

Conference

Symposium on X-Ray and Electron Probe Analysis (1963 : Atlantic City)

Title

Symposium on X-Ray and Electron Probe Analysis; [papers] presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963.

Imprint

Philadelphia, American Society for Testing and Materials [1964]

Series

ASTM special technical publication no. 349

ASTM special technical publication ; no. 349.

Bibliography

Includes bibliographies.

Added Author

ASTM Committee E-2 on Emission Spectroscopy.

American Society for Testing and Materials. Committee E-4 on Metallography.

Research Call Number

VEE (American Society for Testing Materials. Special technical publication. no. 349)