Research Catalog

Correlation of EBIC and SWBXT imaged defects and epilayer growth pits in 6H-SiC Schottky diodes

Title
Correlation of EBIC and SWBXT imaged defects and epilayer growth pits in 6H-SiC Schottky diodes [microform] / C.M. Schnabel ... [et al.].
Publication
[Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 2000]

Details

Additional Authors
  • Schnabel, C. M.
  • NASA Glenn Research Center.
Description
1 v.
Series Statement
[NASA technical memorandum] ; NASA/TM-2000-209648
Uniform Title
NASA technical memorandum ; 209648.
Subject
  • Correlation
  • Synchrotrons
  • Topography
  • Beam currents
  • Electron beams
  • Schottky diodes
  • Crystal defects
Note
  • Shipping list no.: 2000-0603-M.
Reproduction (note)
  • Microfiche.
Call Number
READEX Microfiche NAS 1.15:209648
OCLC
marcive44555025
Title
Correlation of EBIC and SWBXT imaged defects and epilayer growth pits in 6H-SiC Schottky diodes [microform] / C.M. Schnabel ... [et al.].
Imprint
[Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 2000]
Series
[NASA technical memorandum] ; NASA/TM-2000-209648
NASA technical memorandum ; 209648.
Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 2000] 1 microfiche.
Added Author
Schnabel, C. M.
NASA Glenn Research Center.
Gpo Item No.
0830-D (MF)
Sudoc No.
NAS 1.15:209648
Research Call Number
READEX Microfiche NAS 1.15:209648
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