- Additional Authors
- National Institute of Standards and Technology (U.S.)
- Description
- vii, 70 p. : ill.; 28 cm.
- Series Statement
- NISTIR ; 6492
- Subjects
- Note
- "February 2000."
- Shipping list no.: 2000-0762-M.
- Bibliography (note)
- Includes bibliographical references (p. 69-70).
- Reproduction (note)
- Call Number
- READEX Microfiche C 13.58:6492
- OCLC
- marcive44635876
- Author
DeVaux, Christine R.
- Title
A review of U.S. participation in the International Organization for Standardization (ISO) and the International Electrotechnical Commission (IEC) [microform] / Christine R. DeVaux.
- Imprint
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; [Springfield, Va. : National Technical Information Service, distributor, 2000]
- Series
NISTIR ; 6492
- Bibliography
Includes bibliographical references (p. 69-70).
- Reproduction
Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2000 1 microfiche : negative.
- Added Author
National Institute of Standards and Technology (U.S.)
- Gpo Item No.
0247-D (MF)
- Sudoc No.
C 13.58:6492
- Research Call Number
READEX Microfiche C 13.58:6492