- Additional Authors
- NASA Glenn Research Center.
- Description
- 1 v.
- Series Statement
- [NASA technical memorandum] ; NASA/TM-1999-209647
- Uniform Title
- NASA technical memorandum ; 209647.
- Subjects
- Note
- Shipping list no.: 2000-0603-M.
- Reproduction (note)
- Call Number
- READEX Microfiche NAS 1.15:209647
- OCLC
- marcive44555018
- Author
Neudeck, Philip G.
- Title
Electrical impact of SiC structural crystal defects on high electric field devices [microform] / Philip G. Neudeck.
- Imprint
[Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1999]
- Series
[NASA technical memorandum] ; NASA/TM-1999-209647
NASA technical memorandum ; 209647.
- Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 2000] 1 microfiche.
- Added Author
NASA Glenn Research Center.
- Gpo Item No.
0830-D (MF)
- Sudoc No.
NAS 1.15:209647
- Research Call Number
READEX Microfiche NAS 1.15:209647