Research Catalog

ITC : International Test Conference 2000 : proceedings : October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA

Title: ITC : International Test Conference 2000 : proceedings : October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA / sponsored by IEEE Computer Society Test Technology Technical Council, and IEEE Philadelphia Section.
Author: International Test Conference (31st : 2000 : Atlantic City, N.J.)
Publication: Washington, D.C. : International Test Conference ; Piscataway, New Jersey : IEEE, c2000.

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Request for On-site Use Request Scan How do I pick up this item and when will it be ready?	Text	Request in advance	JSF 01-146	Offsite

Details

Additional Authors

Description

xiv, 1158 p. : ill.; 29 cm.

Alternative Title

2000 IEEE International Test Conference
Proceedings International Test Conference 1999

Subjects

Note

Cover title.
"IEEE Catalog Number 00CH37159"--verso of T.p.

Bibliography (note)

Includes bibliographic references and author index.

Call Number

JSF 01-146

ISBN

0780365461 (softbound)
078036547X (casebound)
0780365488 (microfiche)

OCLC

45693335

Conference

International Test Conference (31st : 2000 : Atlantic City, N.J.)

Title

ITC : International Test Conference 2000 : proceedings : October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA / sponsored by IEEE Computer Society Test Technology Technical Council, and IEEE Philadelphia Section.

Imprint

Washington, D.C. : International Test Conference ; Piscataway, New Jersey : IEEE, c2000.

Bibliography

Includes bibliographic references and author index.

Added Author

IEEE Computer Society. Test Technology Technical Committee.

Institute of Electrical and Electronics Engineers. Philadelphia Section.

Research Call Number

JSF 01-146

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