- Additional Authors
- Description
- 1 v.
- Series Statement
- NASA technical memorandum ; 102709
- Subject
- Note
- Distributed to depository libraries in microfiche.
- Reproduction (note)
- Call Number
- READEX Microfiche NAS 1.15:102709
- OCLC
- marcive25293107
- Author
Hearn, Chase P.
- Title
An analysis of the effects of secondary reflections on dual-frequency reflectometers [microform] / C.P. Hearn, C.R. Cockrell, S.D. Harrah.
- Imprint
Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [1990]
- Series
NASA technical memorandum ; 102709
- Reproduction
Microfiche. [Washington, D.C.? : National Aeronautics and Space Administration], 1990. 1 microfiche.
- Added Author
Cockrell, C. R.
Harrah, S. D.
Langley Research Center.
- Gpo Item No.
830-D (MF)
- Sudoc No.
NAS 1.15:102709
- Research Call Number
READEX Microfiche NAS 1.15:102709