- Additional Authors
- Description
- 1 v.
- Series Statement
- NASA technical memorandum ; 104532
- Alternative Title
- Microanalysis of extended test xenon ....
- Subject
- Note
- Distributed to depository libraries in microfiche.
- Shipping list no.: 92-453-M.
- Reproduction (note)
- Call Number
- READEX Microfiche NAS 1.15:104532
- OCLC
- marcive25750454
- Author
Verhey, Timothy R.
- Title
Microanalysis of extended-test xenon hollow cathodes [microform] / Timothy R. Verhey and Michael J. Patterson.
- Imprint
[Washington, DC] : National Aeronautics and Space Administration ; [Springfield, Va. : For sale by the National Technical Information Service, 1991]
- Series
NASA technical memorandum ; 104532
- Reproduction
Microfiche. [Washington, D.C.? : National Aeronautics and Space Administration], 1991. 1 microfiche.
- Added Author
Patterson, Michael J., 1955-
United States. National Aeronautics and Space Administration.
- Gpo Item No.
830-D (MF)
- Sudoc No.
NAS 1.15:104532
- Research Call Number
READEX Microfiche NAS 1.15:104532