Research Catalog

Thermal degradation study of silicon carbide threads developed for advanced flexible thermal protection systems

Title
Thermal degradation study of silicon carbide threads developed for advanced flexible thermal protection systems [microform] / Huy Kim Tran and Paul M. Sawko.
Author
Tran, Huy Kim.
Publication
Moffett Field, Calif. : National Aeronautics and Space Administration, Ames Research Center ; [Springfield, Va. : For sale by the National Technical Information Service, 1992]

Details

Additional Authors
  • Sawko, Paul M.
  • Ames Research Center.
Description
1 v.
Series Statement
NASA technical memorandum ; 103952
Subject
Silicon carbide > Thermal properties
Note
  • Distributed to depository libraries in microfiche.
  • Shipping list no.: 93-0079-M.
Reproduction (note)
  • Microfiche.
Call Number
READEX Microfiche NAS 1.15:103952
OCLC
marcive27759325
Author
Tran, Huy Kim.
Title
Thermal degradation study of silicon carbide threads developed for advanced flexible thermal protection systems [microform] / Huy Kim Tran and Paul M. Sawko.
Imprint
Moffett Field, Calif. : National Aeronautics and Space Administration, Ames Research Center ; [Springfield, Va. : For sale by the National Technical Information Service, 1992]
Series
NASA technical memorandum ; 103952
Reproduction
Microfiche. [Washington, D.C.? : National Aeronautics and Space Administration], 1992. 1 microfiche.
Added Author
Sawko, Paul M.
Ames Research Center.
Gpo Item No.
0830-D (MF)
Sudoc No.
NAS 1.15:103952
Research Call Number
READEX Microfiche NAS 1.15:103952
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