- Additional Authors
- Description
- v, 25 p. : ill.; 28 cm.
- Series Statement
- NIST technical note ; 1280
- Subject
- Note
- Paper version no longer for sale by the Supt. of Docs.
- Distributed to depository libraries in microfiche.
- Shipping list no.: 92-1127-M.
- "August 1990."
- Bibliography (note)
- Includes bibliographical references (p. 11).
- Type of Report (note)
- Reproduction (note)
- Call Number
- READEX Microfiche C 13.46:1280
- OCLC
- marcive27868913
- Author
Wang, Tie Ming.
- Title
Absolute specular reflectometer with an autocollimator telescope and auxiliary mirrors [microform] / Tie Ming Wang, Kenneth L. Eckerle, Jack J. Hsia.
- Imprint
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1990.
- Series
NIST technical note ; 1280
- Type Of Report
Final.
- Bibliography
Includes bibliographical references (p. 11).
- Reproduction
Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1992] 1 microfiche : negative.
- Added Author
Eckerle, Kenneth L.
Hsia, J. J.
National Institute of Standards and Technology (U.S.)
- Gpo Item No.
0249-A (MF)
- Sudoc No.
C 13.46:1280
- Research Call Number
READEX Microfiche C 13.46:1280