- Additional Authors
- National Institute of Standards and Technology (U.S.)
- Description
- iii, 65 p. : ill.; 28 cm.
- Series Statement
- NIST technical note ; 1289
- Subject
- Note
- Paper version no longer for sale by the Supt. of Docs.
- Distributed to depository libraries in microfiche.
- Shipping list no.: 92-2029-M.
- "October 1991."
- Bibliography (note)
- Includes bibliographical references.
- Type of Report (note)
- Reproduction (note)
- Call Number
- READEX Microfiche C 13.46:1289
- OCLC
- marcive27869110
- Author
Wagner, C. D. (Charles Daniel), 1917-
- Title
The NIST X-ray photoelectron spectroscopy (XPS) database [microform] / Charles D. Wagner.
- Imprint
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.
- Series
NIST technical note ; 1289
- Type Of Report
Final.
- Bibliography
Includes bibliographical references.
- Reproduction
Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1992] 1 microfiche : negative.
- Added Author
National Institute of Standards and Technology (U.S.)
- Gpo Item No.
0249-A (MF)
- Sudoc No.
C 13.46:1289
- Research Call Number
READEX Microfiche C 13.46:1289