Research Catalog

Dynamic test/analysis correlation using reduced analytical models

Title
Dynamic test/analysis correlation using reduced analytical models [microform] / Paul E. McGowan, A. Filippo Angelucci, and Mehzad Javeed.
Author
McGowan, Paul E.
Publication
Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; [Springfield, Va. : For sale by the National Technical Information Service, 1992]

Details

Additional Authors
  • Angelucci, A. Filippo.
  • Javeed, Mehzad.
  • Langley Research Center.
Description
1 v.
Series Statement
NASA technical memorandum ; 107671
Alternative Title
Dynamic test analysis correlation using ....
Subject
Structural design
Note
  • Distributed to depository libraries in microfiche.
  • Shipping list no.: 93-0304-M.
Reproduction (note)
  • Microfiche.
Call Number
READEX Microfiche NAS 1.15:107671
OCLC
marcive28138728
Author
McGowan, Paul E.
Title
Dynamic test/analysis correlation using reduced analytical models [microform] / Paul E. McGowan, A. Filippo Angelucci, and Mehzad Javeed.
Imprint
Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; [Springfield, Va. : For sale by the National Technical Information Service, 1992]
Series
NASA technical memorandum ; 107671
Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration], 1992. 1 microfiche.
Added Author
Angelucci, A. Filippo.
Javeed, Mehzad.
Langley Research Center.
Gpo Item No.
0830-D (MF)
Sudoc No.
NAS 1.15:107671
Research Call Number
READEX Microfiche NAS 1.15:107671
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