- Additional Authors
- National Institute of Standards and Technology (U.S.)
- Description
- iv, 54 p. : ill.; 28 cm.
- Series Statement
- NIST special publication ; 400-87
- Semiconductor measurement technology
- Alternative Title
- Programmable reverse bias safe operating area transistor tester.
- Subject
- Transistors > Testing
- Note
- Distributed to depository libraries in microfiche.
- Shipping list no.: 92-1526-M.
- Paper version no longer for sale by the Supt. of Docs.
- "August 1990."
- "CODEN: NSPUE2"--T.p. verso.
- Bibliography (note)
- Includes bibliographical references (p. 54).
- Type of Report (note)
- Reproduction (note)
- Call Number
- READEX Microfiche C 13.10:400-87
- OCLC
- marcive26904567
- Author
Berning, David W.
- Title
A programmable reverse-bias safe operating area transistor tester [microform] / D.W. Berning.
- Imprint
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Springfield, VA : Order from National Technical Information Service], 1990.
- Series
NIST special publication ; 400-87
Semiconductor measurement technology
- Type Of Report
Final.
- Bibliography
Includes bibliographical references (p. 54).
- Reproduction
Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1992] 1 microfiche : negative.
- Added Author
National Institute of Standards and Technology (U.S.)
- Gpo Item No.
0247 (MF)
- Sudoc No.
C 13.10:400-87
- Research Call Number
READEX Microfiche C 13.10:400-87