- Additional Authors
- National Institute of Standards and Technology (U.S.)
- Description
- xv, 84 p. : ill.; 28 cm.
- Series Statement
- NIST special publication ; 500-200. Computer systems technology
- Uniform Title
- NIST special publication ; 500-200.
- NIST special publication. Computer systems technology.
- Subject
- Note
- Distributed to depository libraries in microfiche.
- Shipping list no.: 92-2116-M.
- Paper version no longer for sale by the Supt. of Docs.
- "December 1991."
- Bibliography (note)
- Includes bibliographical references (p. 83-84).
- Type of Report (note)
- Reproduction (note)
- Funding (note)
- Sponsored by U.S. National Archives and Records Administration.
- Call Number
- READEX Microfiche C 13.10:500-200
- OCLC
- marcive26981476
- Author
Podio, Fernando L.
- Title
Development of a testing methodology to predict optical disk life expectancy values [microform] / Fernando L. Podio.
- Imprint
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; [Springfield, VA : Order from National Technical Information Service], 1991.
- Series
NIST special publication ; 500-200. Computer systems technology
NIST special publication ; 500-200.
NIST special publication. Computer systems technology.
- Type Of Report
Final.
- Bibliography
Includes bibliographical references (p. 83-84).
- Funding
Sponsored by U.S. National Archives and Records Administration.
- Reproduction
Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1992] 2 microfiches : negative.
- Added Author
National Institute of Standards and Technology (U.S.)
- Gpo Item No.
0247 (MF)
- Sudoc No.
C 13.10:500-200
- Research Call Number
READEX Microfiche C 13.10:500-200