- Additional Authors
- Description
- xi, 37 p. : ill.; 28 cm.
- Series Statement
- Standard reference materials
- NIST special publication ; 260-117
- Alternative Title
- Antireflecting chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems.
- Subject
- Note
- Distributed to depository libraries in microfiche.
- Shipping list no.: 92-2096-M.
- Paper version no longer for sale by the Supt. of Docs.
- "Issued January 1992."
- Bibliography (note)
- Includes bibliographical references.
- Type of Report (note)
- Reproduction (note)
- Call Number
- READEX Microfiche C 13.10:260-117
- OCLC
- marcive29206275
- Author
Vezzetti, Carol F.
- Title
Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems [microform] / Carol F. Vezzetti, Ruth N. Varner, James E. Potzick.
- Imprint
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Springfield, VA : Order from National Technical Information Service], 1992.
- Series
Standard reference materials
NIST special publication ; 260-117
- Type Of Report
Final.
- Bibliography
Includes bibliographical references.
- Reproduction
Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1992] 1 microfiche : negative.
- Added Author
Varner, Ruth N.
Potzick, James E.
National Institute of Standards and Technology (U.S.)
- Other Form:
original (OCoLC) 27648137
- Gpo Item No.
0247 (MF)
- Sudoc No.
C 13.10:260-117
- Research Call Number
READEX Microfiche C 13.10:260-117