- Additional Authors
- National Institute of Standards and Technology (U.S.)
- Description
- iv, 116 p. : ill.; 28 cm.
- Series Statement
- NIST technical note ; 1338
- Subject
- Note
- Distributed to depository libraries in microfiche.
- Shipping list no.: 92-2065-M.
- Paper version no longer for sale by the Supt. of Docs.
- "Issued April 1990."
- Bibliography (note)
- Includes bibliographical references (p. 108-109).
- Type of Report (note)
- Reproduction (note)
- Call Number
- READEX Microfiche C 13.46:1338
- OCLC
- marcive28175708
- Author
Geyer, Richard G.
- Title
Dielectric characterization and reference materials [microform] / Richard G. Geyer.
- Imprint
Boulder, Colo. : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1990.
- Series
NIST technical note ; 1338
- Type Of Report
Final.
- Bibliography
Includes bibliographical references (p. 108-109).
- Reproduction
Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1992] 2 microfiches : negative.
- Added Author
National Institute of Standards and Technology (U.S.)
- Gpo Item No.
0249-A (MF)
- Sudoc No.
C 13.46:1338
- Research Call Number
READEX Microfiche C 13.46:1338