Research Catalog

Quantitative mapping of pore fraction variations in silicon nitride using an ultrasonic contact scan technique

Title
Quantitative mapping of pore fraction variations in silicon nitride using an ultrasonic contact scan technique [microform] / Don J. Roth ... [et al.].
Publication
[Washington, DC] : National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program ; [Springfield, Va. : National Technical Information Service, distributor], 1993.

Details

Additional Authors
  • Roth, Don J.
  • United States. National Aeronautics and Space Administration. Scientific and Technical Information Program.
Description
1 v.
Series Statement
NASA technical paper ; 3377
Subject
Silicon nitride
Note
  • Distributed to depository libraries in microfiche.
  • Shipping list no.: 94-0014-M.
Reproduction (note)
  • Microfiche.
Call Number
READEX Microfiche NAS 1.60:3377
OCLC
marcive30658737
Title
Quantitative mapping of pore fraction variations in silicon nitride using an ultrasonic contact scan technique [microform] / Don J. Roth ... [et al.].
Imprint
[Washington, DC] : National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program ; [Springfield, Va. : National Technical Information Service, distributor], 1993.
Series
NASA technical paper ; 3377
Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1993] 1 microfiche.
Added Author
Roth, Don J.
United States. National Aeronautics and Space Administration. Scientific and Technical Information Program.
Gpo Item No.
0830-H-15 (MF)
Sudoc No.
NAS 1.60:3377
Research Call Number
READEX Microfiche NAS 1.60:3377
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