- Additional Authors
- Description
- 1 v.
- Series Statement
- NASA contractor report ; NASA CR-183266
- Subject
- Note
- Distributed to depository libraries in microfiche.
- Reproduction (note)
- Call Number
- READEX Microfiche NAS 1.26:183266
- OCLC
- marcive31856247
- Title
X-ray diffraction imaging (topography) of electrooptic crystals by synchrotron radiation [microform] / Bruce Steiner ... [et al.].
- Imprint
[Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1988]
- Series
NASA contractor report ; NASA CR-183266
- Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1988] 1 microfiche.
- Added Author
Steiner, Bruce.
United States. National Aeronautics and Space Administration.
- Gpo Item No.
0830-H-14 (MF)
- Sudoc No.
NAS 1.26:183266
- Research Call Number
READEX Microfiche NAS 1.26:183266