Research Catalog

Determination of impurities in silicon carbide by CTP AES (inductively coupled plasma atmomic emission spectrometry) after coprecipitation with Lanthanum hydroxide

Title
Determination of impurities in silicon carbide by CTP AES (inductively coupled plasma atmomic emission spectrometry) after coprecipitation with Lanthanum hydroxide [microform] / Y. Harada, N. Kurata, G. Furuno.
Author
Harada, Y.
Publication
Washington, DC : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1988]

Details

Additional Authors
  • Kurata, N.
  • Furuno, G.
  • United States. National Aeronautics and Space Administration.
Description
1 v.
Series Statement
NASA technical translation ; NASA TT-20332
Uniform Title
NASA technical translation ; 20332.
Subject
  • Silicon carbide
  • Atomic emission spectroscopy
  • Decomposition (Chemistry)
Note
  • Distributed to depository libraries in microfiche.
Reproduction (note)
  • Microfiche.
Call Number
READEX Microfiche NAS 1.77:20332
OCLC
marcive31895010
Author
Harada, Y.
Title
Determination of impurities in silicon carbide by CTP AES (inductively coupled plasma atmomic emission spectrometry) after coprecipitation with Lanthanum hydroxide [microform] / Y. Harada, N. Kurata, G. Furuno.
Imprint
Washington, DC : National Aeronautics and Space Administration ; [Springfield, Va. : National Technical Information Service, distributor, 1988]
Series
NASA technical translation ; NASA TT-20332
NASA technical translation ; 20332.
Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1988] 1 microfiche.
Added Author
Kurata, N.
Furuno, G.
United States. National Aeronautics and Space Administration.
Gpo Item No.
0830-H-21 (MF)
Sudoc No.
NAS 1.77:20332
Research Call Number
READEX Microfiche NAS 1.77:20332
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