Research Catalog

[Sputter process investigation] final technical report

Title
[Sputter process investigation] [microform] : [material and environment interaction processes investigation] : final technical report / John R. Williams, Michael J. Bozack, and Albert T. Fromhold.
Author
Williams, John R.
Publication
[Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1994]

Details

Additional Authors
  • Bozack, Michael J.
  • Fromhold, A. T.
  • United States. National Aeronautics and Space Administration.
Description
1 v.
Series Statement
NASA contractor report ; NASA CR-193946
Subject
  • Ellipsometry
  • Optical measurement
  • Optical reflection
  • Optical thickness
  • Phase shift
Note
  • Distributed to depository libraries in microfiche.
  • Shipping list no.: 94-0859-M.
Reproduction (note)
  • Microfiche.
Call Number
READEX Microfiche NAS 1.26:193946
OCLC
marcive32027170
Author
Williams, John R.
Title
[Sputter process investigation] [microform] : [material and environment interaction processes investigation] : final technical report / John R. Williams, Michael J. Bozack, and Albert T. Fromhold.
Imprint
[Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1994]
Series
NASA contractor report ; NASA CR-193946
Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1994] 1 microfiche.
Added Author
Bozack, Michael J.
Fromhold, A. T.
United States. National Aeronautics and Space Administration.
Gpo Item No.
0830-H-14 (MF)
Sudoc No.
NAS 1.26:193946
Research Call Number
READEX Microfiche NAS 1.26:193946
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