Research Catalog

Use of photostress to analyze behavior of an aft skirt test specimen

Title: Use of photostress to analyze behavior of an aft skirt test specimen [microform] / prepared by S.C. Gambrell, Jr.
Author: Gambrell, S. C.
Publication: Tuscaloosa, Ala. : The University of Alabama, College of Engineering, Bureau of Engineering Research ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Center, distributor, 1994]

Details

Additional Authors

United States. National Aeronautics and Space Administration.

Description

1 v.

Series Statement

NASA contractor report ; NASA CR-195850
BER report ; no. 607-97

Subject

Note

Distributed to depository libraries in microfiche.
Shipping list no.: 94-0865-M.

Reproduction (note)

Microfiche.

Call Number

READEX Microfiche NAS 1.26:195850

OCLC

marcive32028074

Author

Gambrell, S. C.

Title

Use of photostress to analyze behavior of an aft skirt test specimen [microform] / prepared by S.C. Gambrell, Jr.

Imprint

Tuscaloosa, Ala. : The University of Alabama, College of Engineering, Bureau of Engineering Research ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Center, distributor, 1994]

Series

NASA contractor report ; NASA CR-195850

BER report ; no. 607-97

Reproduction

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1994] 3 microfiches.

Added Author

United States. National Aeronautics and Space Administration.

Gpo Item No.

0830-H-14 (MF)

Sudoc No.

NAS 1.26:195850

Research Call Number

READEX Microfiche NAS 1.26:195850

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