- Additional Authors
- Description
- 1 v.
- Series Statement
- NASA contractor report ; NASA CR-196201
- Subject
- Note
- Distributed to depository libraries in microfiche.
- Shipping list no.: 95-0048-M.
- Reproduction (note)
- Call Number
- READEX Microfiche NAS 1.26:196201
- OCLC
- marcive32164335
- Title
Probability of detection of defects in coating with electronic shearography [microform] : final technical report for period 3 June 1993 through 2 June 1994 / prepared by Gary A. Maddux ... [et al.].
- Imprint
Huntsville, Ala. : Research Institute, the University of Alabama in Huntsville ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1994]
- Series
NASA contractor report ; NASA CR-196201
- Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1994] 1 microfiche.
- Added Author
Maddux, Gary A.
United States. National Aeronautics and Space Administration.
- Gpo Item No.
0830-H-14 (MF)
- Sudoc No.
NAS 1.26:196201
- Research Call Number
READEX Microfiche NAS 1.26:196201