- Additional Authors
- United States. National Aeronautics and Space Administration.
- Description
- 1 v.
- Series Statement
- NASA contractor report ; NASA CR-196474
- Alternative Title
- Fault sensitivity and wear out analysis of VLSI sensitivity
- Subject
- Note
- Distributed to depository libraries in microfiche.
- Shipping list no.: 95-0062-M.
- Reproduction (note)
- Call Number
- READEX Microfiche NAS 1.26:196474
- OCLC
- marcive32320458
- Author
Choi, Gwan Seung.
- Title
Fault-sensitivity and wear-out analysis of VLSI sensitivity [microform] / Gwan Seung Choi.
- Imprint
[Urbana, IL] : Coordinated Science Laboratory, College of Engineering, University of Illinois at Urbana-Champaign ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1994]
- Series
NASA contractor report ; NASA CR-196474
- Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1994] 2 microfiches.
- Added Author
United States. National Aeronautics and Space Administration.
- Gpo Item No.
0830-H-14 (MF)
- Sudoc No.
NAS 1.26:196474
- Research Call Number
READEX Microfiche NAS 1.26:196474