Research Catalog

An integrated approach to system design, reliability, and diagnosis

Title
An integrated approach to system design, reliability, and diagnosis [microform] / F.A. Patterson-Hine and David L. Iverson.
Author
Patterson-Hine, F. A.
Publication
Moffett Field, Calif. : National Aeronautics and Space Administration, Ames Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1990]

Details

Additional Authors
  • Iverson, David L.
  • Ames Research Center.
Description
1 v.
Series Statement
NASA technical memorandum ; 102861
Subject
  • Aerospace engineering
  • Avionics
  • Computer programs
  • Computers
  • Fault trees
  • Functional analysis
  • Reliability
  • Software engineering
  • Systems engineering
Note
  • Distributed to depository libraries in microfiche.
Reproduction (note)
  • Microfiche.
Call Number
READEX Microfiche NAS 1.15:102861
OCLC
marcive32363497
Author
Patterson-Hine, F. A.
Title
An integrated approach to system design, reliability, and diagnosis [microform] / F.A. Patterson-Hine and David L. Iverson.
Imprint
Moffett Field, Calif. : National Aeronautics and Space Administration, Ames Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1990]
Series
NASA technical memorandum ; 102861
Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1990] 1 microfiche.
Added Author
Iverson, David L.
Ames Research Center.
Gpo Item No.
0830-D (MF)
Sudoc No.
NAS 1.15:102861
Research Call Number
READEX Microfiche NAS 1.15:102861
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