Research Catalog

Technique for measuring the dielectic constant of thin materials

Title
Technique for measuring the dielectic constant of thin materials [microform] / K. Saraband and F.T. Ulaby.
Author
Saraband, K.
Publication
[Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1988]

Details

Additional Authors
  • Ulaby, Fawwaz T. (Fawwaz Tayssir), 1943-
  • United States. National Aeronautics and Space Administration.
Description
1 v.
Series Statement
NASA contractor report ; NASA CR-183325
Subject
  • Dielectrics
  • Leaves
  • Permittivity
  • Thin plates
  • Vegetation
Note
  • Distributed to depository libraries in microfiche.
Reproduction (note)
  • Microfiche.
Call Number
READEX Microfiche NAS 1.26:183325
OCLC
marcive32451530
Author
Saraband, K.
Title
Technique for measuring the dielectic constant of thin materials [microform] / K. Saraband and F.T. Ulaby.
Imprint
[Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1988]
Series
NASA contractor report ; NASA CR-183325
Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1988] 1 microfiche.
Added Author
Ulaby, Fawwaz T. (Fawwaz Tayssir), 1943-
United States. National Aeronautics and Space Administration.
Gpo Item No.
0830-H-14 (MF)
Sudoc No.
NAS 1.26:183325
Research Call Number
READEX Microfiche NAS 1.26:183325
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