Research Catalog

Title

Stochastic modeling of crack initiation and short-crack growth under creep and creep-fatigue conditions [microform] / Takayuki Kitamura, Louis J. Ghosn, and Ryuichi Ohtani.

Author

Kitamura, Takayuki.

Publication

[Washington, D.C.] : NASA ; [Springfield, Va. : For sale by the National Technical Information Service, 1989]

Details

Additional Authors

• Ghosn, Louis J.
• Ohtani, Ryuichi, 1938-
• United States. National Aeronautics and Space Administration.

Description

1 v.

Series Statement

NASA technical memorandum ; 101358

Subject

• Crack initiation
• Crack propagation
• Creep analysis
• Creep strength
• Fatigue life
• Models
• Stochastic processes

Note

• Distributed to depository libraries in microfiche.

Reproduction (note)

• Microfiche.

Call Number

READEX Microfiche NAS 1.15:101358

OCLC

marcive32519314

Author

Kitamura, Takayuki.

Title

Stochastic modeling of crack initiation and short-crack growth under creep and creep-fatigue conditions [microform] / Takayuki Kitamura, Louis J. Ghosn, and Ryuichi Ohtani.

Imprint

[Washington, D.C.] : NASA ; [Springfield, Va. : For sale by the National Technical Information Service, 1989]

Series

NASA technical memorandum ; 101358

Reproduction

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1989] 1 microfiche.

Added Author

Ghosn, Louis J.

Ohtani, Ryuichi, 1938-

United States. National Aeronautics and Space Administration.

Gpo Item No.

0830-D (MF)

Sudoc No.

NAS 1.15:101358

Research Call Number

READEX Microfiche NAS 1.15:101358