Research Catalog

Heavy ion induced single event phenomena (SEP) data for semiconductor devices form engineering testing

Title
Heavy ion induced single event phenomena (SEP) data for semiconductor devices form engineering testing [microform] / Donald K. Nichols ... [et al.].
Publication
Pasadena, Calif. : National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology ; [Springfield, Va. : National Technical Information Service, distributor, 1988]

Details

Additional Authors
  • Nichols, Donald K.
  • Jet Propulsion Laboratory (U.S.)
Description
1 v.
Series Statement
NASA contractor report ; NASA CR-184864
Subject
  • Irradiation
  • Latch-up
  • Linear energy transfer (LET)
  • Performance tests
  • Semiconductor devices
  • Single event upsets
Note
  • Distributed to depository libraries in microfiche.
Reproduction (note)
  • Microfiche.
Call Number
READEX Microfiche NAS 1.26:184864
OCLC
marcive32603471
Title
Heavy ion induced single event phenomena (SEP) data for semiconductor devices form engineering testing [microform] / Donald K. Nichols ... [et al.].
Imprint
Pasadena, Calif. : National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology ; [Springfield, Va. : National Technical Information Service, distributor, 1988]
Series
NASA contractor report ; NASA CR-184864
Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1989] 1 microfiche.
Added Author
Nichols, Donald K.
Jet Propulsion Laboratory (U.S.)
Gpo Item No.
0830-H-14 (MF)
Sudoc No.
NAS 1.26:184864
Research Call Number
READEX Microfiche NAS 1.26:184864
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