Research Catalog

Electronic characterization of defects in narrow gap semiconductors final report, November 25, 1992 to November 25, 1994

Title: Electronic characterization of defects in narrow gap semiconductors [microform] final report, November 25, 1992 to November 25, 1994 / James D. Patterson.
Author: Patterson, James D. (James Deane), 1934-
Publication: Marshall Space Flight Center, AL : [National Aeronautics and Space Administration], George C. Marshall Space Flight Center ; [Springfield, Va. : National Technical Information Service, distributor, 1994]

Details

Additional Authors

George C. Marshall Space Flight Center.

Description

1 v.

Series Statement

NASA contractor report ; NASA CR-197217

Subject

Note

Distributed to depository libraries in microfiche.
Shipping list no.: 95-0270-M.

Reproduction (note)

Microfiche.

Call Number

READEX Microfiche NAS 1.26:197217

OCLC

marcive32826016

Author

Patterson, James D. (James Deane), 1934-

Title

Electronic characterization of defects in narrow gap semiconductors [microform] final report, November 25, 1992 to November 25, 1994 / James D. Patterson.

Imprint

Marshall Space Flight Center, AL : [National Aeronautics and Space Administration], George C. Marshall Space Flight Center ; [Springfield, Va. : National Technical Information Service, distributor, 1994]

Series

NASA contractor report ; NASA CR-197217

Reproduction

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1994] 2 microfiches.

Added Author

George C. Marshall Space Flight Center.

Gpo Item No.

0830-H-14 (MF)

Sudoc No.

NAS 1.26:197217

Research Call Number

READEX Microfiche NAS 1.26:197217

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