- Additional Authors
- Description
- 1 v.
- Series Statement
- NASA case ; no. GSC 13, 451-1
- Uniform Title
- NASA case ; GSC-13451-1.
- Subject
- Note
- Distributed to depository libraries in microfiche.
- Shipping list no.: 92-2153-M.
- Reproduction (note)
- Call Number
- READEX Microfiche NAS 1.71:GSC-13451-1
- OCLC
- marcive32943616
- Title
Method and apparatus for determination of material residual stress [microform] / inventor[s], Engmin J. Chern and Yury Flom.
- Imprint
[Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1991]
- Series
NASA case ; no. GSC 13, 451-1
NASA case ; GSC-13451-1.
- Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1992] 1 microfiche.
- Added Author
Chern, Engmin J.
Flom, Y.
United States. National Aeronautics and Space Administration.
- Gpo Item No.
0830-J-10 (MF)
- Sudoc No.
NAS 1.71:GSC-13451-1
- Research Call Number
READEX Microfiche NAS 1.71:GSC-13451-1