Research Catalog

Title

Electronics reliability and measurement technology [microform] : proceedings of a conference ... held at Langley Research Center, Hampton, Virginia, June 3-5, 1986 / edited by Joseph S. Heyman.

Author

Electronics Reliability and Measurement Technology Workshop (1986 : NASA Langley Research Center)

Publication

[Washington, DC] : National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program ; [Springfield, Va. : National Technical Information Service, distributor, 1987]

Details

Additional Authors

• Heyman, Joseph S.
• United States. National Aeronautics and Space Administration. Scientific and Technical Information Program.

Description

1 v.

Series Statement

NASA conference publication ; 2472

Subject

• Component reliability
• Inspection
• Microelectronics
• Nondestructive tests
• Quality control
• Reliability engineering

Note

• Distributed to depository libraries in microfiche.

Reproduction (note)

• Microfiche.

Call Number

READEX Microfiche NAS 1.55:2472

OCLC

marcive33027645

Conference

Electronics Reliability and Measurement Technology Workshop (1986 : NASA Langley Research Center)

Title

Electronics reliability and measurement technology [microform] : proceedings of a conference ... held at Langley Research Center, Hampton, Virginia, June 3-5, 1986 / edited by Joseph S. Heyman.

Imprint

[Washington, DC] : National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program ; [Springfield, Va. : National Technical Information Service, distributor, 1987]

Series

NASA conference publication ; 2472

Reproduction

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1987] 2 microfiches.

Added Author

Heyman, Joseph S.

United States. National Aeronautics and Space Administration. Scientific and Technical Information Program.

Gpo Item No.

0830-H-10 (MF)

Sudoc No.

NAS 1.55:2472

Research Call Number

READEX Microfiche NAS 1.55:2472