Research Catalog

A simple method of obtaining concentration depth-profiles from X-ray diffraction

Title
A simple method of obtaining concentration depth-profiles from X-ray diffraction [microform] / by K.E. Wiedemann, J. Unnam.
Author
Wiedemann, K. E.
Publication
Warrendale, PA : Metallurgical Society of AIME ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1984]

Details

Additional Authors
  • Unnam, Jalaiah.
  • United States. National Aeronautics and Space Administration.
Description
1 v.
Series Statement
  • NASA contractor report ; NASA CR-176262
  • TMS paper selection ; paper no. F84-15
Subject
  • Convolution integrals
  • Depth measurement
  • Diffraction patterns
  • Luminous intensity
  • X ray diffraction
Note
  • Distributed to depository libraries in microfiche.
Reproduction (note)
  • Microfiche.
Call Number
READEX Microfiche NAS 1.26:176262
OCLC
marcive33431336
Author
Wiedemann, K. E.
Title
A simple method of obtaining concentration depth-profiles from X-ray diffraction [microform] / by K.E. Wiedemann, J. Unnam.
Imprint
Warrendale, PA : Metallurgical Society of AIME ; [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1984]
Series
NASA contractor report ; NASA CR-176262
TMS paper selection ; paper no. F84-15
Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1986] 1 microfiche.
Added Author
Unnam, Jalaiah.
United States. National Aeronautics and Space Administration.
Gpo Item No.
0830-H-14 (MF)
Sudoc No.
NAS 1.26:176262
Research Call Number
READEX Microfiche NAS 1.26:176262
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