Research Catalog

Emissivity measurements in thin metallized membrane reflectors used for microwave radiometer sensors

Title
Emissivity measurements in thin metallized membrane reflectors used for microwave radiometer sensors [microform] / L.C. Schroeder ... [et al.].
Publication
Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1995]

Details

Additional Authors
  • Schroeder, Lyle C.
  • Langley Research Center.
Description
1 v.
Series Statement
NASA technical memorandum ; 110179
Subject
  • Approximation
  • Electromagnetic wave transmission
  • Emissivity
  • Inflatable structures
  • Kapton (Trademark)
  • Materials tests
  • Membrane structures
  • Metal films
  • Microwave radiometers
  • Radar reflectors
  • Thin films
  • Transmission loss
Note
  • Distributed to depository libraries in microfiche.
  • Shipping list no.: 96-0033-M.
Reproduction (note)
  • Microfiche.
Call Number
READEX Microfiche NAS 1.15:110179
OCLC
marcive34051775
Title
Emissivity measurements in thin metallized membrane reflectors used for microwave radiometer sensors [microform] / L.C. Schroeder ... [et al.].
Imprint
Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1995]
Series
NASA technical memorandum ; 110179
Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1995] 1 microfiche.
Added Author
Schroeder, Lyle C.
Langley Research Center.
Gpo Item No.
0830-D (MF)
Sudoc No.
NAS 1.15:110179
Research Call Number
READEX Microfiche NAS 1.15:110179
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