Research Catalog

Simplified data reduction methods for the ECT test for mode III interlaminar fracture toughness

Title
Simplified data reduction methods for the ECT test for mode III interlaminar fracture toughness [microform] / Jian Li, T. Kevin O'Brien.
Author
Li, Jian.
Publication
Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1995]

Details

Additional Authors
  • O'Brien, T. Kevin.
  • Langley Research Center.
Description
1 v.
Series Statement
NASA technical memorandum ; 110176
Subject
  • Characterization
  • Composite materials
  • Data reduction
  • Delaminating
  • Fracture mechanics
  • Modulus of elasticity
  • Shear strength
  • Strain energy release rate
  • Toughness
  • Transverse loads
Note
  • Distributed to depository libraries in microfiche.
  • Shipping list no.: 96-0033-M.
Reproduction (note)
  • Microfiche.
Call Number
READEX Microfiche NAS 1.15:110176
OCLC
marcive34051817
Author
Li, Jian.
Title
Simplified data reduction methods for the ECT test for mode III interlaminar fracture toughness [microform] / Jian Li, T. Kevin O'Brien.
Imprint
Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; [Springfield, Va. : National Technical Information Service, distributor, 1995]
Series
NASA technical memorandum ; 110176
Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1995] 1 microfiche.
Added Author
O'Brien, T. Kevin.
Langley Research Center.
Gpo Item No.
0830-D (MF)
Sudoc No.
NAS 1.15:110176
Research Call Number
READEX Microfiche NAS 1.15:110176
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