- Additional Authors
- Description
- 1 v.
- Series Statement
- NASA contractor report ; NASA CR-199713
- Subject
- Note
- Distributed to depository libraries in microfiche.
- Shipping list no.: 96-0197-M.
- Reproduction (note)
- Call Number
- READEX Microfiche NAS 1.26:199713
- OCLC
- marcive34602721
- Title
Defect characterization in ZnGeP₂ by time-resolved photoluminescence [microform] / N. Dietz ... [et al.].
- Imprint
[Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995?]
- Series
NASA contractor report ; NASA CR-199713
- Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1995] 1 microfiche.
- Added Author
Dietz, Nikolaus.
United States. National Aeronautics and Space Administration.
- Gpo Item No.
0830-H-14 (MF)
- Sudoc No.
NAS 1.26:199713
- Research Call Number
READEX Microfiche NAS 1.26:199713