Research Catalog

P-polarized reflectance spectroscopy a high sensitive real-time monitoring technique to study surface kinetics under steady state epitaxial deposition conditions

Title
P-polarized reflectance spectroscopy [microform] : a high sensitive real-time monitoring technique to study surface kinetics under steady state epitaxial deposition conditions / Nikolaus Dietz and Klaus J. Bachmann.
Author
Dietz, Nikolaus.
Publication
[Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995?]

Details

Additional Authors
  • Bachmann, Klaus J.
  • United States. National Aeronautics and Space Administration.
Description
1 v.
Series Statement
NASA contractor report ; NASA CR-199715
Subject
  • Dielectric properties
  • Epitaxy
  • Film thickness
  • Fine structure
  • Laser applications
  • Light scattering
  • Spectral reflectance
  • Spectroscopy
  • Surface layers
Note
  • Distributed to depository libraries in microfiche.
  • Shipping list no.: 96-0197-M.
Reproduction (note)
  • Microfiche.
Call Number
READEX Microfiche NAS 1.26:199715
OCLC
marcive34603011
Author
Dietz, Nikolaus.
Title
P-polarized reflectance spectroscopy [microform] : a high sensitive real-time monitoring technique to study surface kinetics under steady state epitaxial deposition conditions / Nikolaus Dietz and Klaus J. Bachmann.
Imprint
[Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1995?]
Series
NASA contractor report ; NASA CR-199715
Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1995] 1 microfiche.
Added Author
Bachmann, Klaus J.
United States. National Aeronautics and Space Administration.
Gpo Item No.
0830-H-14 (MF)
Sudoc No.
NAS 1.26:199715
Research Call Number
READEX Microfiche NAS 1.26:199715
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