- Additional Authors
- Description
- iv, 88 p. : ill.; 28 cm.
- Series Statement
- NIST special publication .
- Semiconductor measurement technology
- Subject
- Note
- Distributed to depository libraries in microfiche.
- Shipping list no.: 96-0273-M.
- "September 1995."
- Bibliography (note)
- Includes bibliographical references (p. 14).
- Reproduction (note)
- Call Number
- READEX Microfiche C 13.10:400-97
- OCLC
- marcive34871880
- Author
Schuster, C. E.
- Title
Test structure implementation document [microform] : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) / C.E. Schuster ; sponsored by Defense Advanced Research Projects Agency and U.S. Air Force Wright Laboratory.
- Imprint
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington : For sale by the Supt. of Docs., U.S. G.P.O., 1995.
- Series
NIST special publication . 400-97
Semiconductor measurement technology
- Bibliography
Includes bibliographical references (p. 14).
- Reproduction
Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1996] 2 microfiches : negative.
- Added Author
United States. Defense Advanced Research Projects Agency.
Wright Laboratory (Wright-Patterson Air Force Base, Ohio)
National Institute of Standards and Technology (U.S.)
- Gpo Item No.
0247 (MF)
- Sudoc No.
C 13.10:400-97
- Research Call Number
READEX Microfiche C 13.10:400-97