- Additional Authors
- Description
- vii, 91 p. : ill.; 28 cm.
- Series Statement
- NASA reference publication ; 1364
- Subject
- Note
- Distributed to depository libraries in microfiche.
- Shipping list no.: 95-0615-M.
- "March 1995."
- Bibliography (note)
- Includes bibliographical references (p. 77-78).
- Reproduction (note)
- Call Number
- READEX Microfiche NAS 1.61:1364
- OCLC
- marcive35252130
- Author
Eicke, W. G.
- Title
Metrology, measurement assurance program guidelines [microform] / NASA Metrology and Calibration Working Group ; W.G. Eicke, J.P. Riley, K.J. Riley.
- Imprint
[Washington, D.C.?] : NASA ; [Springfield, Va. : National Technical Information Service, distributor, 1995]
- Series
NASA reference publication ; 1364
- Bibliography
Includes bibliographical references (p. 77-78).
- Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1995?] 1 microfiche.
- Added Author
Riley, J. P.
Riley, K. J.
NASA Metrology and Calibration Workshop.
- Gpo Item No.
0830-H-11 (MF)
- Sudoc No.
NAS 1.61:1364
- Research Call Number
READEX Microfiche NAS 1.61:1364