Research Catalog

Effect of crystal defects on minority carrier diffusion length in 6H SiC measured using the electron beam induced current method

Title: Effect of crystal defects on minority carrier diffusion length in 6H SiC measured using the electron beam induced current method [microform] / M. Tabib-Azar.
Author: Tabib-Azar, Massood.
Publication: [Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1997]

Details

Additional Authors

United States. National Aeronautics and Space Administration.

Description

1 v.

Series Statement

[NASA contractor report] ; 205866

Uniform Title

NASA contractor report ; NASA CR-205866.

Subject

Note

Shipping list no.: 98-0441-M.

Reproduction (note)

Microfiche.

Call Number

READEX Microfiche NAS 1.26:205866

OCLC

marcive39026871

Author

Tabib-Azar, Massood.

Title

Effect of crystal defects on minority carrier diffusion length in 6H SiC measured using the electron beam induced current method [microform] / M. Tabib-Azar.

Imprint

[Washington, DC : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1997]

Series

[NASA contractor report] ; 205866

NASA contractor report ; NASA CR-205866.

Reproduction

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1997] 1 microfiche.

Added Author

United States. National Aeronautics and Space Administration.

Gpo Item No.

0830-H-14 (MF)

Sudoc No.

NAS 1.26:205866

Research Call Number

READEX Microfiche NAS 1.26:205866

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