Research Catalog

Optical metrology for industrialization of optical information processing

Title
Optical metrology for industrialization of optical information processing [microform] / David Casasent, C.L. Wilson.
Author
Casasent, D. P. (David Paul)
Publication
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1997]

Details

Additional Authors
  • Wilson, Charles L., 1942-
  • National Institute of Standards and Technology (U.S.)
Description
12 p. : ill.; 28 cm.
Series Statement
NISTIR ; 6060
Subject
  • Optical data processing
  • Optical pattern recognition
  • Information storage and retrieval systems
Note
  • Shipping list no.: 98-0569-M.
  • "September, 1997."
Bibliography (note)
  • Includes bibliographical references (p. 11-12).
Reproduction (note)
  • Microfiche.
Call Number
READEX Microfiche C 13.58:6060
OCLC
marcive39138979
Author
Casasent, D. P. (David Paul)
Title
Optical metrology for industrialization of optical information processing [microform] / David Casasent, C.L. Wilson.
Imprint
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1997]
Series
NISTIR ; 6060
Bibliography
Includes bibliographical references (p. 11-12).
Reproduction
Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [1998] 1 microfiche : negative.
Added Author
Wilson, Charles L., 1942-
National Institute of Standards and Technology (U.S.)
Gpo Item No.
0247-D (MF)
Sudoc No.
C 13.58:6060
Research Call Number
READEX Microfiche C 13.58:6060
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