- Additional Authors
- National Institute of Standards and Technology (U.S.)
- Description
- iii, 57 p. : ill.
- Series Statement
- NIST technical note ; 1390
- Subject
- Electronic noise > Measurement
- Note
- Shipping list no.: 98-0579-M.
- Paper version no longer available for sale by the Supt. of Docs.
- "March 1997."
- Bibliography (note)
- Includes bibliographical references (p. 33-36).
- Reproduction (note)
- Call Number
- READEX Microfiche C 13.46:1390
- OCLC
- marcive39472843
- Author
Randa, J.
- Title
Noise temperature measurements on wafer [microform] / J. Randa.
- Imprint
Boulder, Colo. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.
- Series
NIST technical note ; 1390
- Bibliography
Includes bibliographical references (p. 33-36).
- Reproduction
Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [1998] 1 microfiche : negative.
- Added Author
National Institute of Standards and Technology (U.S.)
- Gpo Item No.
0249-A (MF)
- Sudoc No.
C 13.46:1390
- Research Call Number
READEX Microfiche C 13.46:1390