- Additional Authors
- Description
- 1 v.
- Series Statement
- NASA-TM ; 111685
- Uniform Title
- NASA technical memorandum ; 111685.
- Subject
- Note
- Shipping list no.: 98-0791-M.
- Reproduction (note)
- Call Number
- READEX Microfiche NAS 1.15:111685
- OCLC
- marcive39647979
- Title
Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry [microform] / A.R. Heyd ... [et al.].
- Imprint
[Washington, D.C. : National Aeronautics and Space Administration ; Springfield, Va. : National Technical Information Service, distributor, 1996]
- Series
NASA-TM ; 111685
NASA technical memorandum ; 111685.
- Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1997] 1 microfiche.
- Added Author
Heyd, A. R.
United States. National Aeronautics and Space Administration.
- Gpo Item No.
0830-D (MF)
- Sudoc No.
NAS 1.15:111685
- Research Call Number
READEX Microfiche NAS 1.15:111685