Research Catalog

Impact of radiation hardness and operating temperatures of silicon carbide electronics on space power system mass

Title
Impact of radiation hardness and operating temperatures of silicon carbide electronics on space power system mass [microform] / Albert J. Juhasz, Roy C. Tew, and Gene E. Schwarze.
Author
Juhasz, Albert J.
Publication
[Cleveland, Ohio] : National Aeronautics and Space Administration, Lewis Research Center ; Springfield, VA : National Technical Information Service, distributor, [1998]

Details

Additional Authors
  • Tew, Roy C.
  • Schwarze, Gene E.
  • Lewis Research Center.
Description
1 v.
Series Statement
[NASA technical memorandum] ; NASA/TM-1998-208826
Uniform Title
NASA technical memorandum ; 208826.
Subject
  • Operating temperature
  • Radiation hardening
  • Silicon carbides
  • Spacecraft power supplies
  • Heat radiators
  • Radiation effects
Note
  • Shipping list no.: 99-0559-M.
Reproduction (note)
  • Microfiche.
Call Number
READEX Microfiche NAS 1.15:208826
OCLC
marcive41584954
Author
Juhasz, Albert J.
Title
Impact of radiation hardness and operating temperatures of silicon carbide electronics on space power system mass [microform] / Albert J. Juhasz, Roy C. Tew, and Gene E. Schwarze.
Imprint
[Cleveland, Ohio] : National Aeronautics and Space Administration, Lewis Research Center ; Springfield, VA : National Technical Information Service, distributor, [1998]
Series
[NASA technical memorandum] ; NASA/TM-1998-208826
NASA technical memorandum ; 208826.
Reproduction
Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1999] 1 microfiche.
Added Author
Tew, Roy C.
Schwarze, Gene E.
Lewis Research Center.
Gpo Item No.
0830-D (MF)
Sudoc No.
NAS 1.15:208826
Research Call Number
READEX Microfiche NAS 1.15:208826
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