- Additional Authors
- Description
- vi, 106 p. : ill.
- Series Statement
- NIST special publication ; 260-131
- Standard reference materials
- Alternative Title
- Certification of one hundred millimeter diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements
- Subject
- Note
- "Supercedes NIST special publication 260-131, August 1997."
- Shipping list no.: 99-0777-M.
- "Issued June 1999."
- Bibliography (note)
- Includes bibliographical references (p. 44-45).
- Reproduction (note)
- Call Number
- READEX Microfiche C 13.48/4:260-131
- OCLC
- marcive42011509
- Author
Ehrstein, James R.
- Title
The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements [microform] / J.R. Ehrstein, M.C. Croarkin.
- Imprint
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O., 1999.
- Edition
1999 ed.
- Series
NIST special publication ; 260-131
Standard reference materials
- Bibliography
Includes bibliographical references (p. 44-45).
- Reproduction
Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [1999] 2 microfiches : negative.
- Added Author
Croarkin, M. C. (Mary Carroll), 1934-
National Institute of Standards and Technology (U.S.)
- Gpo Item No.
0248-B (MF)
- Sudoc No.
C 13.48/4:260-131
- Research Call Number
READEX Microfiche C 13.48/4:260-131