- Additional Authors
- Description
- 20 p. : ill.
- Series Statement
- NISTIR ; 6429
- Subject
- Note
- Shipping list no.: 2000-0425-M.
- "November 1999."
- Bibliography (note)
- Includes bibliographical references (p. 18-20).
- Reproduction (note)
- Call Number
- READEX Microfiche C 13.58:6429
- OCLC
- marcive43877144
- Author
Flater, David.
- Title
Testability of product data management interfaces [microform] / David Flater, KC Morris.
- Imprint
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1999]
- Series
NISTIR ; 6429
- Bibliography
Includes bibliographical references (p. 18-20).
- Reproduction
Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [2000] 1 microfiches : negative.
- Added Author
Morris, K. C.
National Institute of Standards and Technology (U.S.)
- Gpo Item No.
0247-D (MF)
- Sudoc No.
C 13.58:6429
- Research Call Number
READEX Microfiche C 13.58:6429